RLCkt II: Deep Reinforcement Learning via Attention-Aware Sampling for Analog Integrated Circuit Transistor Sizing Automation

Wangge Zuo; Wenzhao Sun; Bijian Lan; Jing Wan

doi:10.1109/iseda62518.2024.10617708

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RLCkt II: Deep Reinforcement Learning via Attention-Aware Sampling for Analog Integrated Circuit Transistor Sizing Automation

Wangge Zuo Wenzhao Sun Bijian Lan Jing Wan

Year: 2024 Pages: 177-181

DOI: 10.1109/iseda62518.2024.10617708

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Keywords:

Sizing Automation Computer science Reinforcement learning Transistor Analog multiplier Sampling (signal processing) Reinforcement Electronic engineering Electrical engineering Artificial intelligence Engineering Analog signal Computer hardware Voltage Telecommunications Mechanical engineering Digital signal processing

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VLSI and FPGA Design Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Low-power high-performance VLSI design

Physical Sciences → Engineering → Electrical and Electronic Engineering

RLCkt II: Deep Reinforcement Learning via Attention-Aware Sampling for Analog Integrated Circuit Transistor Sizing Automation

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