TF²: Few-Shot Text-Free Training-Free Defect Image Generation for Industrial Anomaly Inspection

Qianzi Yu; Kai Zhu; Yang Cao; Feijie Xia; Yu Kang

doi:10.1109/tcsvt.2024.3424435

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TF²: Few-Shot Text-Free Training-Free Defect Image Generation for Industrial Anomaly Inspection

Qianzi Yu Kai Zhu Yang Cao Feijie Xia Yu Kang

Year: 2024 Journal: IEEE Transactions on Circuits and Systems for Video Technology Vol: 34 (11)Pages: 11825-11837 Publisher: Institute of Electrical and Electronics Engineers

DOI: 10.1109/tcsvt.2024.3424435

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Keywords:

Artificial intelligence Computer science Pattern recognition (psychology) Shot (pellet) Computer vision Materials science

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Image and Object Detection Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Image Processing Techniques and Applications

Physical Sciences → Engineering → Media Technology

TF²: Few-Shot Text-Free Training-Free Defect Image Generation for Industrial Anomaly Inspection

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