Structural elucidation, morphological properties, dielectric properties and their physical interpretation of cerium-substituted cobalt and barium-based M-type hexagonal nano ferrites

Abstract

Abstract This research uses the sol–gel method to look into how adding Co 2+ and Ce 3+ dopant cations changes the structure, shape, and electrical properties of M-type Ba hexagonal ferrites that have been synthesized. x-ray diffraction (XRD) analysis confirms the successful formation of the targeted hexagonal M-type crystal structure. We observed a reduction in unit cell volume and lattice parameters as the dopant concentration increased, indicating the effective incorporation of dopant ions into the crystal lattice. When the doping process happened, needle-like grain shapes appeared, which could be seen with a field emission scanning electron microscope (FESEM). As the concentration of the dopant increased, the dielectric spectroscopic measurements revealed an increase in the loss tangent (tan δ ) from 0.05 to 3.68, and a decrease in the dielectric constant ( ε ′) from 283 to 3.41. This suggests a reduction in polarization and dielectric permittivity, as well as increased energy dissipation within the material. The electric modulus spectra showed relaxation behaviour that was non-Debye-type, which is another sign that there are complex and multifaceted ways for charges to move. The measurements of relaxation time and AC conductivity showed that the relaxation intervals were not regular and that the conductivity dropped from 2.22*10 –4 Ω −1 m −1 to 1.4*10 –7 Ω −1 m −1 as the doping concentration increased. Based on these findings, it seems that the processes of conductivity and dielectric relaxation play a big role in how charges move around in the doped ferrites. We validated complex impedance data obtained through electrochemical impedance spectroscopy (EIS) software against calculated impedance values. The derived grain and grain boundary characteristics also agreed with the observed grain distribution and boundaries from the micrographs, further corroborating the analysis.