Optical diffraction tomography based on quadriwave lateral shearing interferometry

Xun Yuan; Junwei Min; Yuan Zhou; Yuge Xue; Chen Bai; Manman Li; Xiaohao Xu; Baoli Yao

doi:10.1016/j.optlastec.2024.111124

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Optical diffraction tomography based on quadriwave lateral shearing interferometry

Xun Yuan Junwei Min Yuan Zhou Yuge Xue Chen Bai Manman Li Xiaohao Xu Baoli Yao

Year: 2024 Journal: Optics & Laser Technology Vol: 177 Pages: 111124-111124 Publisher: Elsevier BV

DOI: 10.1016/j.optlastec.2024.111124

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Keywords:

Optics Interferometry Diffraction Optical coherence tomography Shearing (physics) Materials science Tomography Shearing interferometer Optical path length Phase (matter) Physics Astronomical interferometer

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Digital Holography and Microscopy

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Optical Coherence Tomography Applications

Physical Sciences → Engineering → Biomedical Engineering

Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Optical diffraction tomography based on quadriwave lateral shearing interferometry

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