Deep semi-supervised clustering based on pairwise constraints and sample similarity

Xiao Qin; Changan Yuan; Jianhui Jiang; Long Chen

doi:10.1016/j.patrec.2023.12.010

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Deep semi-supervised clustering based on pairwise constraints and sample similarity

Xiao Qin Changan Yuan Jianhui Jiang Long Chen

Year: 2023 Journal: Pattern Recognition Letters Vol: 178 Pages: 1-6 Publisher: Elsevier BV

DOI: 10.1016/j.patrec.2023.12.010

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Keywords:

Cluster analysis Pairwise comparison Artificial intelligence Similarity (geometry) Correlation clustering Computer science Pattern recognition (psychology) Leverage (statistics) Sample (material) Data mining Machine learning Image (mathematics)

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Domain Adaptation and Few-Shot Learning

Physical Sciences → Computer Science → Artificial Intelligence

Face and Expression Recognition

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Text and Document Classification Technologies

Physical Sciences → Computer Science → Artificial Intelligence

Deep semi-supervised clustering based on pairwise constraints and sample similarity

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