JOURNAL ARTICLE

One-Dimensional Binary Convolutional Neural Network Accelerator Design for Bearing Fault Diagnosis

Zih-Syuan SyuChing‐Hung Lee

Year: 2023 Journal:   IEEE Sensors Journal Vol: 24 (3)Pages: 3649-3658   Publisher: IEEE Sensors Council

Abstract

In the field of equipment anomaly detection, anomalies in equipment or tooling machines can be detected earlier by analyzing vibration signals. However, hardware platforms, such as graphics processing units (GPUs), tensor processing units (TPUs), and workstations, are commonly used for the applications of artificial intelligence (AI), which limits the practical applications due to high-power consumption and high cost; the corresponding large amount of computation reduces the inference speed in real-time industrial environments. In this study, we propose a binary neural network (BNN) accelerator and implement it in a field-programmable gate array (FPGA) for bearing fault diagnosis. By using a 1-D convolutional neural network (CNN), we extract the features of vibration signals and classify the classes of bearing faults with high accuracy. The model weights are trained with only one bit by using a knowledge distillation and binarization algorithm to reduce the storage space. We adopt the FPGA, a reprogrammable, low-power, low-cost platform for CNN implementation. The original convolutional operation is replaced with a more efficient algorithm and a specialized binary model computation engine is designed to accelerate model inference and reduce ON-chip resource utilization. Experimental results and comparisons are introduced to show the optimized binary model required only 0.42 ms to infer on the hardware platform, which is 150 times faster than a 32-bit floating-point neural network of the same architecture and still maintained a higher testing accuracy of 98.5%.

Keywords:
Convolutional neural network Computer science Field-programmable gate array Artificial neural network Computation Gate array Fault (geology) Binary number Inference Computer engineering Computer hardware Embedded system Pattern recognition (psychology) Artificial intelligence Algorithm

Metrics

7
Cited By
1.74
FWCI (Field Weighted Citation Impact)
38
Refs
0.82
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Machine Fault Diagnosis Techniques
Physical Sciences →  Engineering →  Control and Systems Engineering
Anomaly Detection Techniques and Applications
Physical Sciences →  Computer Science →  Artificial Intelligence
Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering

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