Intra-variance Guided Metric Learning for Face Forgery Detection

Zhentao Chen; Junlin Hu

doi:10.1007/978-981-99-8565-4_14

ScienceGate Book Chapters

BOOK-CHAPTER

Intra-variance Guided Metric Learning for Face Forgery Detection

Zhentao Chen Junlin Hu

Year: 2023 Lecture notes in computer science Pages: 140-149 Publisher: Springer Science+Business Media

DOI: 10.1007/978-981-99-8565-4_14

Get Full-Text PDF Get Analytical Report

Keywords:

Computer science Artificial intelligence Generalization Metric (unit) Face (sociological concept) Face detection Perspective (graphical) Machine learning Facial recognition system Performance metric Variance (accounting) Transformer Computer vision Pattern recognition (psychology) Mathematics Voltage

Metrics

Cited By

0.54

FWCI (Field Weighted Citation Impact)

Refs

0.72

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Face recognition and analysis

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Generative Adversarial Networks and Image Synthesis

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Digital Media Forensic Detection

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Intra-variance Guided Metric Learning for Face Forgery Detection

Metrics

Citation History

Topics

Related Documents

Dual Frequency-Guided Spatiotemporal Feature Learning for Face Forgery Detection

AGIL-SwinT: Attention-guided inconsistency learning for face forgery detection

Modal-Guided Multi-Domain Inconsistency Learning for Face Forgery Detection

Attention-guided Fine-grained Feature Learning For Robust Face Forgery Detection

Learning to Discover Forgery Cues for Face Forgery Detection