A Dual-view Semi-supervised Learning Framework for Combinatorial Few-shot Fault Diagnosis

Abstract

The accurate and comprehensive fault diagnosis is pivotal for the maintenance of mechanical equipment, which may directly impact the safety in production and avoid unnecessary losses of equipment. With the pervasively adopted sensing components, sensing data can be collected from mechanical equipment and analyzed for fault diagnosis. Previous solutions apply sophisticated deep learning models for such fault diagnosis tasks and have achieved impressive performance. However, these methods usually ignore the existences of diverse characteristics of faults, and formulate the fault diagnosis as a simple classification problem. Considering necessity of comprehensive and multi-view fault diagnosis, this work proposes a novel dual-view learning framework for combinatorial mechanical fault classification. The framework includes dual encoders to simultaneously learn the feature representation tied with the position and size of faults on equipment. Then these features are mutually mixed for better representation and the mixed features are merged and feed into deep neural networks for further representation learning. The query samples are classified through metric-based comparison to search for the closest type of composite fault. Moreover, the proposed framework also applies typical metric-based meta learning method to handle the issue of small training datasets, and adopts semi-supervised learning method to make use of both labeled and unlabeled samples. Finally, the experimental results on public datasets show that the proposed method can outperform previous solutions and achieve state-of-the-art performance.