DiPS: Discriminative pseudo-label sampling with self-supervised transformers for weakly supervised object localization

Shakeeb Murtaza; Soufiane Belharbi; Marco Pedersoli; Aydin Sarraf; Éric Granger

doi:10.1016/j.imavis.2023.104838

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DiPS: Discriminative pseudo-label sampling with self-supervised transformers for weakly supervised object localization

Shakeeb Murtaza Soufiane Belharbi Marco Pedersoli Aydin Sarraf Éric Granger

Year: 2023 Journal: Image and Vision Computing Vol: 140 Pages: 104838-104838 Publisher: Elsevier BV

DOI: 10.1016/j.imavis.2023.104838

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Keywords:

Discriminative model Artificial intelligence Overfitting Computer science Pattern recognition (psychology) Transformer Leverage (statistics) Classifier (UML) Novelty Computer vision Machine learning Artificial neural network

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Advanced Neural Network Applications

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Image and Video Retrieval Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Domain Adaptation and Few-Shot Learning

Physical Sciences → Computer Science → Artificial Intelligence

DiPS: Discriminative pseudo-label sampling with self-supervised transformers for weakly supervised object localization

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