JOURNAL ARTICLE

Defect Prediction Model for Software Projects using Naïve Bayesian Classifier

K. SureshK. Jayasakthi VelmuruganS. HemavathiV. Kavitha

Year: 2023 Journal:   International Journal of Engineering Trends and Technology Vol: 71 (9)Pages: 170-177
Keywords:
Computer science Bayesian probability Naive Bayes classifier Classifier (UML) Machine learning Artificial intelligence Data mining Software Operating system Support vector machine

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Topics

Software Engineering Research
Physical Sciences →  Computer Science →  Information Systems
Software Reliability and Analysis Research
Physical Sciences →  Computer Science →  Software
Software Engineering Techniques and Practices
Physical Sciences →  Computer Science →  Information Systems

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