Defect Prediction Model for Software Projects using Naïve Bayesian Classifier

K. Suresh; K. Jayasakthi Velmurugan; S. Hemavathi; V. Kavitha

doi:10.14445/22315381/ijett-v71i9p216

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Defect Prediction Model for Software Projects using Naïve Bayesian Classifier

K. Suresh K. Jayasakthi Velmurugan S. Hemavathi V. Kavitha

Year: 2023 Journal: International Journal of Engineering Trends and Technology Vol: 71 (9)Pages: 170-177

DOI: 10.14445/22315381/ijett-v71i9p216

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Keywords:

Computer science Bayesian probability Naive Bayes classifier Classifier (UML) Machine learning Artificial intelligence Data mining Software Operating system Support vector machine

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Software Engineering Research

Physical Sciences → Computer Science → Information Systems

Software Reliability and Analysis Research

Physical Sciences → Computer Science → Software

Software Engineering Techniques and Practices

Physical Sciences → Computer Science → Information Systems

Defect Prediction Model for Software Projects using Naïve Bayesian Classifier

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