A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene

Maosen Wang; Mengtian Wang; Jun Liu; Shaozhang Niu; Wen Zhang; Jiaqi Zhao

doi:10.1007/978-3-031-36625-3_20

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A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene

Maosen Wang Mengtian Wang Jun Liu Shaozhang Niu Wen Zhang Jiaqi Zhao

Year: 2023 Lecture notes in computer science Pages: 246-259 Publisher: Springer Science+Business Media

DOI: 10.1007/978-3-031-36625-3_20

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Keywords:

Computer science Artificial intelligence Factory (object-oriented programming) Feature extraction Segmentation Object detection Computer vision Pattern recognition (psychology) Feature (linguistics) Sample (material) Noise (video) Image (mathematics)

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Image Processing Techniques and Applications

Physical Sciences → Engineering → Media Technology

Image and Object Detection Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

A Fabric Defect Detection Model Based on Feature Extraction of Weak Sample Scene

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