Empirical mode decomposition and local binary pattern based feature extraction for face recognition

Abstract

Facial recognition is a challenging pattern recognition problem in computer vision. This paper proposes a face recognition system that uses Empirical Mode Decomposition (EMD) and Local Binary Pattern (LBP) based feature extraction for a robust face recognition system. This scheme initially decomposes the image into 2N number of IMF (Intrinsic Mode Function) images, where N numbers of IMF images are estimated in the X direction and N number of IMF images are estimated in the Y direction. From the 2N number of IMFs, the M number of best matching IMF image pairs is estimated using 2D Discrete Fourier Transform (DFT). The IMF pair is added to extract the IC-LBP (Intensity Compensated-Local Binary Pattern) features. The IC-LBP features are extracted from the IMF images such that the center intensity is adjusted based on an adaptive intensity threshold. The use of EMD and IC-LBP features uses the essential descriptors that best represent a facial image. The same process is repeated in the testing phase where the test image is categorized from the trained images using the Naïve Bayes algorithm. The performance evaluation was done using the Yale, MORPH, and FGNET using metrics such as time complexity and recognition rate on different types of test face images like partial faces, different lightning, and rotation. Results show that the proposed face recognition system outperforms the traditional algorithms. Results show that the proposed face recognition system outperforms the traditional algorithms.