Study on Oxidation of Si(100)-2x1 Surfaces by Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy

Hiroshi Ikegami; Kenji Ohmori; Hiroya Ikeda; Hirotaka Iwano; Shigeaki Zaima; Yukio Yasuda

doi:10.7567/ssdm.1995.s-i-1-3

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Study on Oxidation of Si(100)-2x1 Surfaces by Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy

Hiroshi Ikegami Kenji Ohmori Hiroya Ikeda Hirotaka Iwano Shigeaki Zaima Yukio Yasuda

Year: 1995

DOI: 10.7567/ssdm.1995.s-i-1-3

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Keywords:

Scanning tunneling microscope Materials science Scanning tunneling spectroscopy Electrochemical scanning tunneling microscope Spectroscopy Spin polarized scanning tunneling microscopy Quantum tunnelling Scanning probe microscopy Optoelectronics Nanotechnology Scanning ion-conductance microscopy Microscopy Scanning electron microscope Scanning confocal electron microscopy Optics Composite material Physics

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Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Molecular Junctions and Nanostructures

Physical Sciences → Engineering → Electrical and Electronic Engineering

Study on Oxidation of Si(100)-2x1 Surfaces by Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy

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