Attention-based deep meta-transfer learning for few-shot fine-grained fault diagnosis

Chuanjiang Li; Shaobo Li; Huan Wang; Fengshou Gu; Andrew Ball

doi:10.1016/j.knosys.2023.110345

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JOURNAL ARTICLE

Attention-based deep meta-transfer learning for few-shot fine-grained fault diagnosis

Chuanjiang Li Shaobo Li Huan Wang Fengshou Gu Andrew Ball

Year: 2023 Journal: Knowledge-Based Systems Vol: 264 Pages: 110345-110345 Publisher: Elsevier BV

DOI: 10.1016/j.knosys.2023.110345

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Keywords:

Computer science Transfer of learning Artificial intelligence Deep learning A priori and a posteriori Generalization Feature (linguistics) Machine learning Feature extraction Fault (geology) Process (computing) Granularity Pattern recognition (psychology) Data mining

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Machine Fault Diagnosis Techniques

Physical Sciences → Engineering → Control and Systems Engineering

Non-Destructive Testing Techniques

Physical Sciences → Engineering → Mechanical Engineering

Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Attention-based deep meta-transfer learning for few-shot fine-grained fault diagnosis

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