Source selection and transfer defect learning based cross-project defect prediction

Chuyue Wang; Jiawei Chu; Yuehua Li; Xikai Li; Wanzhi Wen; Ningbo Zhu; Bingqing Ye

doi:10.1504/ijcsm.2022.10053250

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Source selection and transfer defect learning based cross-project defect prediction

Chuyue Wang Jiawei Chu Yuehua Li Xikai Li Wanzhi Wen Ningbo Zhu Bingqing Ye

Year: 2022 Journal: International Journal of Computing Science and Mathematics Vol: 16 (3)Pages: 195-195 Publisher: Inderscience Publishers

DOI: 10.1504/ijcsm.2022.10053250

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Keywords:

Computer science Selection (genetic algorithm) Transfer of learning Transfer (computing) Algorithm Artificial intelligence

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Infrastructure Maintenance and Monitoring

Physical Sciences → Engineering → Civil and Structural Engineering

Non-Destructive Testing Techniques

Physical Sciences → Engineering → Mechanical Engineering

Source selection and transfer defect learning based cross-project defect prediction

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