JOURNAL ARTICLE

SAPENet: Self-Attention based Prototype Enhancement Network for Few-shot Learning

Xilang HuangSeon Han Choi

Year: 2022 Journal:   Pattern Recognition Vol: 135 Pages: 109170-109170   Publisher: Elsevier BV
Keywords:
Discriminative model Computer science Artificial intelligence Benchmark (surveying) Feature (linguistics) Metric (unit) Pattern recognition (psychology) Class (philosophy) Exploit Channel (broadcasting) Sample (material) Machine learning Feature learning

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76
Cited By
14.68
FWCI (Field Weighted Citation Impact)
40
Refs
0.99
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Domain Adaptation and Few-Shot Learning
Physical Sciences →  Computer Science →  Artificial Intelligence
Multimodal Machine Learning Applications
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
COVID-19 diagnosis using AI
Health Sciences →  Medicine →  Radiology, Nuclear Medicine and Imaging
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