One-Port Methods for Complex Permittivity Measurement. Short Review

Abstract

The fast-growing field of different applications for dielectric material requires of development new types of such kinds of material with a wide range of characteristics and different aggregate states. One of the most important parts of developing new material is a verification procedure of its electrodynamical characteristics, which gives us the possibility to compare measured values with calculated ones. For measurement material properties nowadays use a lot of different methods for the complex permittivity extraction in the wide frequency range, but all of these methods can be divided into two big groups – one-port and two-port methods. In this article, one-port methods for complex permittivity measurement were reviewed, such as open-ended coaxial probe (OCP), short circuit probe (SCP), coplanar probe (CP), and free space (FP) measurements. The area of implementation of the most popular one-port methods and realization features are described in the article. The positive and negative sides of each of the presented methods are considered.