JOURNAL ARTICLE

A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS

Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone

Year: 2022 Journal:   Microelectronics Reliability Vol: 138 Pages: 114733-114733   Publisher: Elsevier BV
Keywords:
CMOS Reliability (semiconductor) Field-programmable gate array Radiation hardening Radiation Sensitivity (control systems) Electronic engineering Computer science Engineering Optoelectronics Physics Embedded system Optics

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1.18
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19
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0.75
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Citation History

Topics

Radiation Effects in Electronics
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
Low-power high-performance VLSI design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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