A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS

Sarah Azimi; Corrado De Sio; Andrea Portaluri; Daniele Rizzieri; Luca Sterpone

doi:10.1016/j.microrel.2022.114733

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A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS

Sarah Azimi Corrado De Sio Andrea Portaluri Daniele Rizzieri Luca Sterpone

Year: 2022 Journal: Microelectronics Reliability Vol: 138 Pages: 114733-114733 Publisher: Elsevier BV

DOI: 10.1016/j.microrel.2022.114733

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Keywords:

CMOS Reliability (semiconductor) Field-programmable gate array Radiation hardening Radiation Sensitivity (control systems) Electronic engineering Computer science Engineering Optoelectronics Physics Embedded system Optics

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Radiation Effects in Electronics

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Low-power high-performance VLSI design

Physical Sciences → Engineering → Electrical and Electronic Engineering

A comparative radiation analysis of reconfigurable memory technologies: FinFET versus bulk CMOS

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