JOURNAL ARTICLE

Thermal Analysis of Gallium Oxide-Based Field-Effect Transistors on Different Substrates

Pharyanshu KachhawaVaishali ChaudharyNidhi Chaturvedi

Year: 2022 Journal:   Journal of Electronic Materials Vol: 51 (11)Pages: 6379-6387   Publisher: Springer Science+Business Media
Keywords:
Gallium Materials science Silicon carbide Gallium nitride Substrate (aquarium) Silicon Optoelectronics Oxide Field-effect transistor Transistor Electronic engineering Nanotechnology Electrical engineering Layer (electronics) Composite material Metallurgy Engineering

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0.50
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Citation History

Topics

Ga2O3 and related materials
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
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