JOURNAL ARTICLE

Unsupervised UNet for Fabric Defect Detection

Kuan-Hsien LiuSong-Jie ChenTsung-Jung Liu

Year: 2022 Journal:   2022 IEEE International Conference on Consumer Electronics - Taiwan Pages: 205-206

Abstract

Currently, neural network based defect detection systems usually need to collect a large number of defect samples for training, and it takes a lot of manpower to mark labels and clean the subsequent data. This is a time-consuming process, and it makes the whole system less effective. In this paper, a neural network based method for fabric surface defect detection is proposed. By training positive clean samples, it can learn through neural network without collecting negative defective samples, which greatly shortens the landing time of whole system. Our proposed system can achieve 99% detection accuracy.

Keywords:
Computer science Artificial neural network Artificial intelligence Process (computing) Pattern recognition (psychology) Training set Machine learning Computer vision Operating system

Metrics

16
Cited By
6.36
FWCI (Field Weighted Citation Impact)
21
Refs
0.98
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics
Image and Object Detection Techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
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