JOURNAL ARTICLE

Depth estimation from a single SEM image using pixel-wise fine-tuning with multimodal data

Tim HoubenT. J. HuismanMaxim PisarencoFons van der SommenPeter H. N. de With

Year: 2022 Journal:   Machine Vision and Applications Vol: 33 (4)   Publisher: Springer Science+Business Media
Keywords:
Critical dimension Computer science Pixel Metrology Artificial neural network Artificial intelligence A priori and a posteriori Ground truth Algorithm Optics Physics

Metrics

20
Cited By
2.80
FWCI (Field Weighted Citation Impact)
45
Refs
0.89
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology
Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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