JOURNAL ARTICLE

Monocular Depth Estimation from a Single Infrared Image

Daechan HanYukyung Choi

Year: 2022 Journal:   Electronics Vol: 11 (11)Pages: 1729-1729   Publisher: Multidisciplinary Digital Publishing Institute

Abstract

Thermal infrared imaging is attracting much attention due to its strength against illuminance variation. However, because of the spectral difference between thermal infrared images and RGB images, the existing research on self-supervised monocular depth estimation has performance limitations. Therefore, in this study, we propose a novel Self-Guided Framework using a Pseudolabel predicted from RGB images. Our proposed framework, which solves the problem of appearance matching loss in the existing framework, transfers the high accuracy of Pseudolabel to the thermal depth estimation network by comparing low- and high-level pixels. Furthermore, we propose Patch-NetVLAD Loss, which strengthens local detail and global context information in the depth map from thermal infrared imaging by comparing locally global patch-level descriptors. Finally, we introduce an Image Matching Loss to estimate a more accurate depth map in a thermal depth network by enhancing the performance of the Pseudolabel. We demonstrate that the proposed framework shows significant performance improvement even when applied to various depth networks in the KAIST Multispectral Dataset.

Keywords:
Artificial intelligence Computer science Monocular Multispectral image Computer vision RGB color model Pixel Context (archaeology) Matching (statistics) Thermal infrared Depth map Thermography Infrared Image (mathematics) Remote sensing Mathematics Geography Optics Statistics Physics

Metrics

4
Cited By
0.50
FWCI (Field Weighted Citation Impact)
34
Refs
0.59
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Vision and Imaging
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology
Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
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