Hall effect measurements on flash evaporated cadmium sulphide thin films

doi:10.1016/0026-2714(79)90128-8

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Hall effect measurements on flash evaporated cadmium sulphide thin films

Year: 1979 Journal: Microelectronics Reliability Vol: 19 (4)Pages: 316-316 Publisher: Elsevier BV

DOI: 10.1016/0026-2714(79)90128-8

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Keywords:

Optoelectronics Materials science Field-effect transistor Short-channel effect Channel length modulation Schottky diode Substrate (aquarium) Silicon Schottky barrier Subthreshold conduction Transistor Flash (photography) Velocity saturation Field effect Subthreshold slope Saturation (graph theory) Electrical engineering Voltage MOSFET Engineering Optics Physics Diode

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Advancements in Semiconductor Devices and Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and interfaces

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Semiconductor Quantum Structures and Devices

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Hall effect measurements on flash evaporated cadmium sulphide thin films

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