A substrate integrated waveguide probe applicable to broadband complex permittivity measurements

Abstract

Summary form only given, as follows. A planar-type probe with substrate integrated waveguide(SIW) structure has been developed for permittivity measurement. The proposed probe consists of a microstrip line, a shielded stripline, and a coaxial aperture. The shielded stripline was formed by placing via-hole arrays along the stripline to form a SIW. The proposed probe shows distortion-free permittivity measurement up to 30 GHz, which is more than twice the bandwidth available from the conventional planar coaxial probe.