JOURNAL ARTICLE

Annealing Temperature Dependence of Properties of Cu2ZnSnS4Thin Films Prepared by Sol–Gel Sulfurization Method

K MaedaKunihiko TanakaYuya NakanoHisao Uchiki

Year: 2011 Journal:   Japanese Journal of Applied Physics Vol: 50 (5S2)Pages: 05FB08-05FB08   Publisher: Institute of Physics

Abstract

Cu2ZnSnS4 (CZTS) thin films were fabricated by a sol–gel sulfurization method with a rapid thermal process. The films preheated at 250 °C for 1 h and sulfurized from 350 to 600 °C for 1 h were investigated. The chemical composition of sulfur was 40% for the preheated film and 50% for the films sulfurized at temperatures higher than 400 °C. The grain size of the films markedly increased with increasing sulfurization temperature from 400 to 450 °C and that of the films sulfurized at temperatures higher than 450 °C was ∼2 µm. The preheated film and the films sulfurized at temperatures lower than 400 °C were composed of CuxS and CZTS. The CuxS phase was eliminated from the CZTS films by sulfurization at temperatures higher than 500 °C.

Keywords:
CZTS Materials science Annealing (glass) Thin film Sol-gel Grain size Chemical engineering Sulfur Phase (matter) Metallurgy Analytical Chemistry (journal) Nanotechnology Chemistry Chromatography Organic chemistry

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Topics

Chalcogenide Semiconductor Thin Films
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Physical Sciences →  Materials Science →  Materials Chemistry

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