Stress Evolution during Li-Intercalation/De-Intercalation in Model Thin Film C-Si Composite Electrodes

Amartya Mukhopadhyay; Anton Tokranov; Xingcheng Xiao; Kevin Sena; Fei Guo; Robert H. Hurt; Brian W. Sheldon

doi:10.1149/ma2011-01/6/289

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Stress Evolution during Li-Intercalation/De-Intercalation in Model Thin Film C-Si Composite Electrodes

Amartya Mukhopadhyay Anton Tokranov Xingcheng Xiao Kevin Sena Fei Guo Robert H. Hurt Brian W. Sheldon

Year: 2011 Journal: ECS Meeting Abstracts Vol: MA2011-01 (6)Pages: 289-289 Publisher: Institute of Physics

DOI: 10.1149/ma2011-01/6/289

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Abstract

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Keywords:

Intercalation (chemistry) Materials science Composite number Electrode Stress (linguistics) Thin film Composite material Nanotechnology Chemistry Inorganic chemistry Physical chemistry

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Stress Evolution during Li-Intercalation/De-Intercalation in Model Thin Film C-Si Composite Electrodes

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