Current multiplication in metal-insulator-semiconductor (MIS) tunnel diodes

doi:10.1016/0026-2714(74)90400-4

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Current multiplication in metal-insulator-semiconductor (MIS) tunnel diodes

Year: 1974 Journal: Microelectronics Reliability Vol: 13 (6)Pages: 449-449 Publisher: Elsevier BV

DOI: 10.1016/0026-2714(74)90400-4

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Keywords:

Diode Semiconductor Insulator (electricity) Multiplication (music) Optoelectronics Materials science Tunnel diode Electrical engineering Engineering Physics Acoustics

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Advancements in Semiconductor Devices and Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor Quantum Structures and Devices

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Current multiplication in metal-insulator-semiconductor (MIS) tunnel diodes

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