Vladimir Kratky: I am extremely pleased and honored indeed to be here. What I have to say is necessarily from the point of view of a photogrammetrist and I hope you will keep this in mind when you respond to my remarks.
Hanwen ChangH.L. GarvinE. G. LoewenW. R. HunterJeremy M. LernerMichael C. Hutley
KEVIN GILSONC. S. McCamyALAN SHEPPRobert F. AbramsonAlbert J. Derr