JOURNAL ARTICLE

Observations of electron and hole transport through thin SiO2 films

Year: 1983 Journal:   Microelectronics Reliability Vol: 23 (1)Pages: 196-196   Publisher: Elsevier BV
Keywords:
Noise (video) Electron Silicon Physics Hot electron Flicker noise Atomic physics Johnson–Nyquist noise Condensed matter physics Optoelectronics Materials science Electrical engineering Computational physics Noise figure Quantum mechanics Computer science Engineering

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Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor Quantum Structures and Devices
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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