JOURNAL ARTICLE
Fine line thin dielectric circuit board characterization
Year: 1997 Journal: Microelectronics Reliability Vol: 37 (4)Pages: 702-702 Publisher: Elsevier BV
Keywords:
Default mode network Neuroscience Resting state fMRI Thalamus Posterior cingulate Major depressive disorder Psychology Prefrontal cortex Anterior cingulate cortex Medicine Functional magnetic resonance imaging Cognition
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Topics
Functional Brain Connectivity Studies
Life Sciences → Neuroscience → Cognitive Neuroscience
Advanced MRI Techniques and Applications
Health Sciences → Medicine → Radiology, Nuclear Medicine and Imaging
Atomic and Subatomic Physics Research
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
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