JOURNAL ARTICLE
MICROSTRUCTURAL CHARACTERIZATION OF V-DEFECTS IN INGAN/GAN MULTIQUANTUM WELLS
Year: 2020 Journal: Письма в Журнал экспериментальной и теоретической физики Vol: 111 (5-6(3))Pages: 301-302 Publisher: Springer Science+Business Media
Keywords:
Characterization (materials science) Materials science Optoelectronics Quantum well Gallium nitride Optics Nanotechnology Physics Layer (electronics) Laser
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Oil and Gas Production Techniques
Physical Sciences → Engineering → Ocean Engineering
Offshore Engineering and Technologies
Physical Sciences → Engineering → Ocean Engineering
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