Relative elemental sensitivity factors in non-resonant laser-SNMS

Michael Wahl; D. Koch; W. Berthold; A. Wucher

doi:10.1007/bf00322068

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Relative elemental sensitivity factors in non-resonant laser-SNMS

Michael Wahl D. Koch W. Berthold A. Wucher

Year: 1995 Journal: Analytical and Bioanalytical Chemistry Vol: 353 (3-4)Pages: 354-359 Publisher: Springer Science+Business Media

DOI: 10.1007/bf00322068

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Keywords:

Ionization Atomic physics Reflectron Laser Mass spectrometry Chemistry Excimer laser Photoionization Kinetic energy Atmospheric-pressure laser ionization Analytical Chemistry (journal) Ion Time-of-flight mass spectrometry Optics Physics

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Ion-surface interactions and analysis

Physical Sciences → Engineering → Computational Mechanics

Mass Spectrometry Techniques and Applications

Physical Sciences → Chemistry → Spectroscopy

Analytical chemistry methods development

Physical Sciences → Chemistry → Analytical Chemistry

Relative elemental sensitivity factors in non-resonant laser-SNMS

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