Scanning tunnelling microscopy studies of heteroepitaxy: CaF2 on Si(111)

Robert A. Wolkow; Phaedon Avouris

doi:10.1111/j.1365-2818.1870.tb06342.x

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Scanning tunnelling microscopy studies of heteroepitaxy: CaF2 on Si(111)

Robert A. Wolkow Phaedon Avouris

Year: 1870 Journal: The Monthly Microscopical Journal Vol: 3 (2)Pages: 167-173 Publisher: Wiley

DOI: 10.1111/j.1365-2818.1870.tb06342.x

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Keywords:

Quantum tunnelling Scanning tunneling microscope Valence (chemistry) Silicon Band gap Materials science Condensed matter physics Scanning tunneling spectroscopy Epitaxy Thermal conduction Valence band Spectral line Optoelectronics Chemistry Layer (electronics) Nanotechnology Physics Composite material

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Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Metal and Thin Film Mechanics

Physical Sciences → Engineering → Mechanics of Materials

Advanced Materials Characterization Techniques

Physical Sciences → Engineering → Biomedical Engineering

Scanning tunnelling microscopy studies of heteroepitaxy: CaF2 on Si(111)

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