CdSe Embedded Zrhfo Gate Dielectric Nonvolatile Memories – Charge Trapping and Breakdown Studies

Yue Kuo; Chi-Chou Lin

doi:10.1149/ma2013-02/27/2016

ScienceGate Book Chapters

JOURNAL ARTICLE

CdSe Embedded Zrhfo Gate Dielectric Nonvolatile Memories – Charge Trapping and Breakdown Studies

Yue Kuo Chi-Chou Lin

Year: 2013 Journal: ECS Meeting Abstracts Vol: MA2013-02 (27)Pages: 2016-2016 Publisher: Institute of Physics

DOI: 10.1149/ma2013-02/27/2016

Get Full-Text PDF Get Analytical Report

Abstract

Abstract not Available.

Keywords:

Trapping Optoelectronics Materials science Non-volatile memory Charge (physics) Dielectric Gate dielectric Dielectric strength Electrical engineering Voltage Physics Transistor Engineering

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.38

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Topics

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Memory and Neural Computing

Physical Sciences → Engineering → Electrical and Electronic Engineering

Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

CdSe Embedded Zrhfo Gate Dielectric Nonvolatile Memories – Charge Trapping and Breakdown Studies

Abstract

Metrics

Topics

Related Documents