JOURNAL ARTICLE

Optimum censored accelerated life tests for normal and lognormal life distributions

Year: 1976 Journal:   Microelectronics Reliability Vol: 15 (3)Pages: 179-179   Publisher: Elsevier BV
Keywords:
Log-normal distribution Statistics Accelerated life testing Mathematics Reliability engineering Econometrics Engineering Weibull distribution

Metrics

2
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.61
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Insurance, Mortality, Demography, Risk Management
Social Sciences →  Social Sciences →  Demography
Global Health Care Issues
Health Sciences →  Health Professions →  General Health Professions

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