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JOURNAL ARTICLE

Optimum censored accelerated life tests for normal and lognormal life distributions

Year: 1976 Journal:   Microelectronics Reliability Vol: 15 (3)Pages: 179-179   Publisher: Elsevier BV
DOI: 10.1016/0026-2714(76)90657-0
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Keywords:
Log-normal distribution Statistics Accelerated life testing Mathematics Reliability engineering Econometrics Engineering Weibull distribution

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Topics

Insurance, Mortality, Demography, Risk Management
Social Sciences →  Social Sciences →  Demography
Global Health Care Issues
Health Sciences →  Health Professions →  General Health Professions

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