JOURNAL ARTICLE

An Improved ICP Point Cloud Registration Algorithm Based on Three-Points Congruent Sets

Peng YuYang Yong-qianAizhong TianChangqing DuXiaofan LiuBiying PeiKaixin GuYimu GuoSongyang Che

Year: 2021 Journal:   2021 3rd International Conference on Artificial Intelligence and Advanced Manufacture (AIAM) Pages: 407-411

Abstract

ICP (Iterative Closest Point) is the most widely used point cloud registration algorithm. However, some shortcomings still exist in this algorithm, such as (1) the need to manually determine the initial value of the registration; (2) the low efficiency for large-scale point cloud registration. Therefore, this paper proposes an improved ICP point cloud registration algorithm based on the three-points congruent sets. Firstly, the algorithm narrows the search of corresponding points by extracting 3D-SIFT key points. Then, possible corresponding points are confirmed by the position relationship between the centroid and key points. The optimal transformation matrix can also be determined based on the error function. Finally, the two point clouds are accurately aligned according to the resulted optimal transformation matrix and ICP algorithm. Experimentally, the algorithm is proved to be efficient without manual intervention.

Keywords:
Iterative closest point Point cloud Algorithm Computer science Scale-invariant feature transform Transformation (genetics) Transformation matrix Centroid Point (geometry) Matrix (chemical analysis) Key (lock) Position (finance) Artificial intelligence Mathematics Feature extraction Kinematics Geometry

Metrics

9
Cited By
3.42
FWCI (Field Weighted Citation Impact)
4
Refs
0.94
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Robotics and Sensor-Based Localization
Physical Sciences →  Engineering →  Aerospace Engineering
3D Surveying and Cultural Heritage
Physical Sciences →  Earth and Planetary Sciences →  Geology
Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition

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