Measurements of complex permittivity with waveguide resonator using perturbation technique

Abstract

An X-band waveguide resonator is used to measure the complex permittivity of solid-state materials. The measurement technique uses the perturbation technique. The sample is inserted in the waveguide resonator in a cylindrical form. The sample shifts the resonance frequencies. The resonance frequencies and shift frequencies are measured using an HP network analyzer. Three different reference materials are used to check the accuracy of the measurement technique. The reference materials are: Rexolite, HYD-Cast, and RT/Duroid. A good agreement between the measured dielectric constant and the given values in the literature is observed. The advantage of such a technique is that a very small volume of the sample is needed. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 269–272, 1999.