JOURNAL ARTICLE
Low-temperature scanning tunneling microscopy
Year: 2000 Journal: Uspekhi Fizicheskih Nauk Vol: 170 (9)Pages: 995-995 Publisher: Lebedev Physical Institute
Abstract
ì ªÐÕÇÅÓÂÎßÐÞÇ ÔØÇÏÞ Ð ÑÔÐÑÄÇ GaAs [11].ì ¬ÓÇÏÐËÇÄÞÇ ÒÑÎÇÄÞÇ ÕÓÂÐÊËÔÕÑÓÞ Ô ÍÄÂÐÕÑÄÞÏË ÕÑÚÍÂÏË Ge Ä ÍÂÐÂÎÇ [12].ì ¶ÑÕÑÚÖÄÔÕÄËÕÇÎßÐÞÇ ÏÂÕÓËÚÐÞÇ ÏÑAEÖÎË ËÐ×ÓÂ-ÍÓÂÔÐÑÅÑ (ª¬) AEËÂÒÂÊÑР(3 ë 5 ÏÍÏ) РÑÔÐÑÄÇ ÅÇÕÇÓÑÒÇ-ÓÇØÑAE GeSi/Si [13].ì ª¬ ÎÂÊÇÓÞ Ô ÄÇÓÕËÍÂÎßÐÞÏ ÓÇÊÑÐÂÕÑÓÑÏ ÏÑÜÐÑ-ÔÕßá AEÑ 20 £Õ Ä ËÏÒÖÎßÔÇ Ë AEÎËÐÑÌ ÄÑÎÐÞ 0,95 ÏÍÏ [14].ì ®ÂÕÓËÚÐÞÇ ª¬ (5 ÏÍÏ) ×ÑÕÑÒÓËÇÏÐËÍË Ð ÒÎÇÐÍÂØ CdHgTe [15].4. ©ÂÍÎáÚÇÐËÇ ²ÂÃÑÕ ÄÞÒÑÎÐâÇÕÔâ ÒÓË ÒÑAEAEÇÓÉÍÇ ¤ÑÔÖAEÂÓÔÕÄÇÐÐÑÌ ÒÓÑÅÓÂÏÏÞ "£ÇAEÖÜËÇ ÐÂÖÚÐÞÇ ÛÍÑÎÞ ² ¶" (ÅÓÂÐÕ 00
Keywords:
Scanning tunneling microscope Materials science Microscopy Quantum tunnelling Nanotechnology Optoelectronics Optics Physics
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FWCI (Field Weighted Citation Impact)
4
Refs
0.32
Citation Normalized Percentile
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Topics
Force Microscopy Techniques and Applications
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
Advanced Materials Characterization Techniques
Physical Sciences → Engineering → Biomedical Engineering
Surface and Thin Film Phenomena
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
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