BOOK-CHAPTER
Hydrogenated Microcrystalline Silicon Thin Films
Ying ZhaoXiaodan ZhangLisha BaiBaojie Yan
Year: 2019 Pages: 693-756
Keywords:
Materials science Solar cell Photocurrent Amorphous silicon Plasma-enhanced chemical vapor deposition Optoelectronics Amorphous solid Substrate (aquarium) Grain boundary Absorption (acoustics) Doping Chemical vapor deposition Crystalline silicon Composite material Microstructure Crystallography Chemistry
Metrics
3
Cited By
1.28
FWCI (Field Weighted Citation Impact)
110
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Thin-Film Transistor Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences → Materials Science → Materials Chemistry
Silicon and Solar Cell Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Related Documents
BOOK-CHAPTER
Hydrogenated Microcrystalline Silicon Thin Films
Ying ZhaoXiaodang ZhangLisha BaiBaojie Yan
Year: 2018 Pages: 1-64
JOURNAL ARTICLE
Stress in Hydrogenated Microcrystalline Silicon Thin Films
D PeiróC. VozJ. BertomeuJ. AndreuElena MartínezJ. Esteve
Journal: MRS Proceedings Year: 1999 Vol: 557
JOURNAL ARTICLE
Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films
M. GüneşD. AkdaşÖmer Faruk GöktaşR. CariusJ. KlomfaßF. Finger
Journal: Journal of Materials Science Materials in Electronics Year: 2003 Vol: 14 (10/12)Pages: 729-730
JOURNAL ARTICLE
Instability effects in hydrogenated microcrystalline silicon thin films
Gökhan YILMAZE. TuranM. GüneşVladimir SmirnovF. FingerR. Brüggemann
Journal: Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics Year: 2010 Vol: 7 (3-4)Pages: 700-703
JOURNAL ARTICLE
Hydrogen evolution in hydrogenated microcrystalline silicon carbide thin films
Soumia NemmourSiham DjoumiFatiha KailP. RouraPere Roca i CabarrocasL. Chahed
Journal: Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena Year: 2019 Vol: 37 (3)