Low-rank supervised and semi-supervised multi-metric learning for classification

Ping Sun; Liming Yang

doi:10.1016/j.knosys.2021.107787

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JOURNAL ARTICLE

Low-rank supervised and semi-supervised multi-metric learning for classification

Ping Sun Liming Yang

Year: 2021 Journal: Knowledge-Based Systems Vol: 236 Pages: 107787-107787 Publisher: Elsevier BV

DOI: 10.1016/j.knosys.2021.107787

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Keywords:

Overfitting Metric (unit) Machine learning Semi-supervised learning Computer science Artificial intelligence Supervised learning Stability (learning theory) Rank (graph theory) Mathematics Artificial neural network

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Face and Expression Recognition

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Image and Video Retrieval Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

COVID-19 diagnosis using AI

Health Sciences → Medicine → Radiology, Nuclear Medicine and Imaging

Low-rank supervised and semi-supervised multi-metric learning for classification

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