JOURNAL ARTICLE

Segmentation phase measuring deflectometry for measuring structured specular surfaces

Yongjia XuYuemin WangFeng GaoXiangqian Jiang

Year: 2021 Journal:   The International Journal of Advanced Manufacturing Technology Vol: 119 (3-4)Pages: 2271-2283   Publisher: Springer Science+Business Media
Keywords:
Specular reflection Stylus Computer science Profilometer Artificial intelligence Computer vision Segmentation Structured light Measure (data warehouse) Specular highlight Phase (matter) Optics Materials science Surface finish Physics

Metrics

14
Cited By
1.33
FWCI (Field Weighted Citation Impact)
30
Refs
0.82
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Optical Systems and Laser Technology
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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