Segmentation phase measuring deflectometry for measuring structured specular surfaces

Yongjia Xu; Yuemin Wang; Feng Gao; Xiangqian Jiang

doi:10.1007/s00170-021-08439-8

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Segmentation phase measuring deflectometry for measuring structured specular surfaces

Yongjia Xu Yuemin Wang Feng Gao Xiangqian Jiang

Year: 2021 Journal: The International Journal of Advanced Manufacturing Technology Vol: 119 (3-4)Pages: 2271-2283 Publisher: Springer Science+Business Media

DOI: 10.1007/s00170-021-08439-8

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Keywords:

Specular reflection Stylus Computer science Profilometer Artificial intelligence Computer vision Segmentation Structured light Measure (data warehouse) Specular highlight Phase (matter) Optics Materials science Surface finish Physics

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Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Measurement and Metrology Techniques

Physical Sciences → Engineering → Mechanical Engineering

Optical Systems and Laser Technology

Physical Sciences → Engineering → Electrical and Electronic Engineering

Segmentation phase measuring deflectometry for measuring structured specular surfaces

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