JOURNAL ARTICLE

Oxidation Resistance and Preferred Orientation of TiAlN Thin Films

用勸 朴昌鉉 白M yeong-YongWey

Year: 2002 Journal:   Korean Journal of Materials Research Vol: 12 (8)Pages: 676~681-676~681   Publisher: Materials Research Society of Korea

Abstract

Microstructure, mechanical properties, and oxidation resistance of TiAIN thin films deposited on quenched and tempered STD61 tool steel by arc ion plating were studied using XRD, XPS and micro-balance. The TiAIN film was grown with the (200) orientation. The grain size of TiAIN thin film decreased with increasing Al contents, while chemical binding energy increased with Al contents. When hard coating films were oxidized at $850^{\circ}C$ in air, oxidation resistance of both TiN and TiCN films became relatively lower since the surface of films formed non-protective film such as $TiO_2$. However, oxidation resistance of TiAIN film was excellent because its surface formed protective layer such as $_A12$$O_3$ and $_Al2$$Ti_{7}$$O_{15}$, which suppressed oxygen intrusion.

Keywords:
Materials science X-ray photoelectron spectroscopy Microstructure Ion plating Thin film Coating Metallurgy Layer (electronics) Tin Grain size Composite material Chemical engineering Nanotechnology

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Topics

Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
Diamond and Carbon-based Materials Research
Physical Sciences →  Materials Science →  Materials Chemistry

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