BOOK-CHAPTER

Electronic Structure of Metal Overlayers on Si(111) Surface

Hideo Nagayoshi

Year: 1985 Springer series in solid-state sciences Pages: 167-173   Publisher: Springer Nature
Keywords:
Angle-resolved photoemission spectroscopy Materials science X-ray photoelectron spectroscopy Superlattice Monolayer Extended X-ray absorption fine structure Semiconductor Electronic structure Photoemission spectroscopy Metal Electron diffraction Low-energy electron diffraction Scattering Spectroscopy Diffraction Low-energy ion scattering Absorption (acoustics) Ultraviolet photoelectron spectroscopy Absorption spectroscopy Chemistry Nanotechnology Optics Optoelectronics Computational chemistry Physics Nuclear magnetic resonance

Metrics

3
Cited By
3.77
FWCI (Field Weighted Citation Impact)
16
Refs
0.94
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Advanced Chemical Physics Studies
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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