Electronic Structure of Metal Overlayers on Si(111) Surface

Hideo Nagayoshi

doi:10.1007/978-3-642-82423-4_21

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Electronic Structure of Metal Overlayers on Si(111) Surface

Hideo Nagayoshi

Year: 1985 Springer series in solid-state sciences Pages: 167-173 Publisher: Springer Nature

DOI: 10.1007/978-3-642-82423-4_21

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Keywords:

Angle-resolved photoemission spectroscopy Materials science X-ray photoelectron spectroscopy Superlattice Monolayer Extended X-ray absorption fine structure Semiconductor Electronic structure Photoemission spectroscopy Metal Electron diffraction Low-energy electron diffraction Scattering Spectroscopy Diffraction Low-energy ion scattering Absorption (acoustics) Ultraviolet photoelectron spectroscopy Absorption spectroscopy Chemistry Nanotechnology Optics Optoelectronics Computational chemistry Physics Nuclear magnetic resonance

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Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Advanced Chemical Physics Studies

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Electronic Structure of Metal Overlayers on Si(111) Surface

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