Optical and X-Ray Investigation of Indium Oxide Films on Sapphire Substrates

A. A. Tikhii; K. A. Svyrydova; Yu. I. Zhikhareva; I. V. Zhikharev

doi:10.1007/s10812-021-01268-3

ScienceGate Book Chapters

JOURNAL ARTICLE

Optical and X-Ray Investigation of Indium Oxide Films on Sapphire Substrates

A. A. Tikhii K. A. Svyrydova Yu. I. Zhikhareva I. V. Zhikharev

Year: 2021 Journal: Journal of Applied Spectroscopy Vol: 88 (5)Pages: 975-979 Publisher: Springer Science+Business Media

DOI: 10.1007/s10812-021-01268-3

Get Full-Text PDF Get Analytical Report

Keywords:

Materials science Layer (electronics) Substrate (aquarium) Refractive index Crystallite Indium Sapphire Sputter deposition Deposition (geology) Band gap Oxide Transition layer Thin film Optics Optoelectronics Analytical Chemistry (journal) Sputtering Composite material Nanotechnology Metallurgy Chemistry

Metrics

Cited By

0.08

FWCI (Field Weighted Citation Impact)

Refs

0.35

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Transition Metal Oxide Nanomaterials

Physical Sciences → Materials Science → Polymers and Plastics

Optical and X-Ray Investigation of Indium Oxide Films on Sapphire Substrates

Metrics

Citation History

Topics

Related Documents

Spectral and X-Ray Studies of Indium Oxide Films on Sapphire Substrates

Obtaining Iron-Oxide Films on Sapphire Substrates

Optical and X-Ray Studies of Indium Oxide Films Deposited by DC Magnetron Sputtering

X-Ray characterisation of indium phosphide substrates

X-ray photoemission spectroscopy studies of Sn-doped indium-oxide films