Effects of Lift-Off on Microwave NDE Using an Open-Ended Rectangular Waveguide

John M. Liu; M. Allen Matteson

doi:10.1007/978-1-4613-0383-1_93

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Effects of Lift-Off on Microwave NDE Using an Open-Ended Rectangular Waveguide

John M. Liu M. Allen Matteson

Year: 1996 Review of Progress in Quantitative Nondestructive Evaluation Pages: 713-718

DOI: 10.1007/978-1-4613-0383-1_93

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Keywords:

Microwave Materials science Classification of discontinuities Microwave imaging Dielectric Eddy current Waveguide Acoustics Nondestructive testing Optics Electronic engineering Optoelectronics Electrical engineering Engineering Physics Telecommunications

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Ultrasonics and Acoustic Wave Propagation

Physical Sciences → Engineering → Mechanics of Materials

Geophysical Methods and Applications

Physical Sciences → Engineering → Ocean Engineering

Non-Destructive Testing Techniques

Physical Sciences → Engineering → Mechanical Engineering

Effects of Lift-Off on Microwave NDE Using an Open-Ended Rectangular Waveguide

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