Apple Defect Detection Method Based on Convolutional Neural Network

Xu Zheng; Tao Shen; Shuhui Bi; Qinjun Zhao

doi:10.1007/978-3-030-82562-1_37

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Apple Defect Detection Method Based on Convolutional Neural Network

Xu Zheng Tao Shen Shuhui Bi Qinjun Zhao

Year: 2021 Lecture notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering Pages: 398-404

DOI: 10.1007/978-3-030-82562-1_37

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Keywords:

Convolutional neural network Artificial intelligence Computer science Set (abstract data type) Data set Pattern recognition (psychology) Test set Process (computing) Artificial neural network Image (mathematics) Training set Computer vision

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Spectroscopy and Chemometric Analyses

Physical Sciences → Chemistry → Analytical Chemistry

Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Smart Agriculture and AI

Life Sciences → Agricultural and Biological Sciences → Plant Science

Apple Defect Detection Method Based on Convolutional Neural Network

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