Pixel-super-resolution lensfree microscopy based on multiple-wavelength scanning

Abstract

We present a wavelength-scanning-based lensfree microscopy that generates high-resolution reconstructions from undersampled raw measurements captured at multiple wavelengths.The reconstruction result of the standard 1951 USAF achieves a half-pitch lateral resolution of 775 nm, corresponding to a numerical aperture of ∼ 1.0, across a large field of view (∼ 29.85 mm²). Compared with other super-resolution methods such as lateral or axial shift-based device and illumination source rotation design, wavelength scanning avoids the need for shifting/rotating mechanical components. This wavelength-scanning super-resolution method would benefit the research and development of more stable lensfree microscopy system.