JOURNAL ARTICLE

Robust Ellipse Fitting With Laplacian Kernel Based Maximum Correntropy Criterion

Chenlong HuGang WangK. C. HoJunli Liang

Year: 2021 Journal:   IEEE Transactions on Image Processing Vol: 30 Pages: 3127-3141   Publisher: Institute of Electrical and Electronics Engineers

Abstract

The performance of ellipse fitting may significantly degrade in the presence of outliers, which can be caused by occlusion of the object, mirror reflection or other objects in the process of edge detection. In this paper, we propose an ellipse fitting method that is robust against the outliers, and thus maintaining stable performance when outliers can be present. We formulate an optimization problem for ellipse fitting based on the maximum entropy criterion (MCC), having the Laplacian as the kernel function from the well-known fact that the l1 -norm error measure is robust to outliers. The optimization problem is highly nonlinear and non-convex, and thus is very difficult to solve. To handle this difficulty, we divide it into two subproblems and solve the two subproblems in an alternate manner through iterations. The first subproblem has a closed-form solution and the second one is cast as a convex second-order cone program (SOCP) that can reach the global solution. By so doing, the alternate iterations always converge to an optimal solution, although it can be local instead of global. Furthermore, we propose a procedure to identify failed fitting of the algorithm caused by local convergence to a wrong solution, and thus, it reduces the probability of fitting failure by restarting the algorithm at a different initialization. The proposed robust ellipse fitting method is next extended to the coupled ellipses fitting problem. Both simulated and real data verify the superior performance of the proposed ellipse fitting method over the existing methods.

Keywords:
Ellipse Outlier Initialization Mathematical optimization Curve fitting Algorithm Mathematics Computer science Kernel (algebra) Optimization problem Artificial intelligence

Metrics

31
Cited By
2.56
FWCI (Field Weighted Citation Impact)
49
Refs
0.91
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Image and Object Detection Techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology
Anomaly Detection Techniques and Applications
Physical Sciences →  Computer Science →  Artificial Intelligence

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