Scanning tunneling microscopy of Si(001)

Robert J. Hamers; R. M. Tromp; J. E. Demuth

doi:10.1007/978-94-011-1812-5_16

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Scanning tunneling microscopy of Si(001)

Robert J. Hamers R. M. Tromp J. E. Demuth

Year: 1986 Perspectives in condensed matter physics Pages: 118-132 Publisher: Springer Nature (Netherlands)

DOI: 10.1007/978-94-011-1812-5_16

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Keywords:

Scanning tunneling microscope Faceting Vacancy defect Materials science Dimer Annealing (glass) Crystallography Surface reconstruction Condensed matter physics Quantum tunnelling Molecular physics Chemical physics Nanotechnology Surface (topology) Chemistry Optoelectronics Geometry Physics Metallurgy

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Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Force Microscopy Techniques and Applications

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advanced Materials Characterization Techniques

Physical Sciences → Engineering → Biomedical Engineering

Scanning tunneling microscopy of Si(001)

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