Ultrahigh Dimensional Multi-Class Linear Discriminant Analysis by Pairwise Sure Independence Screening

Rui Pan; Hansheng Wang; Runze Li

doi:10.2139/ssrn.2562126

ScienceGate Book Chapters

JOURNAL ARTICLE

Ultrahigh Dimensional Multi-Class Linear Discriminant Analysis by Pairwise Sure Independence Screening

Rui Pan Hansheng Wang Runze Li

Year: 2015 Journal: SSRN Electronic Journal Publisher: RELX Group (Netherlands)

DOI: 10.2139/ssrn.2562126

Get Full-Text PDF Get Analytical Report

Keywords:

Linear discriminant analysis Pairwise comparison Independence (probability theory) Class (philosophy) Mathematics Artificial intelligence Pattern recognition (psychology) Statistics Computer science Econometrics

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Face and Expression Recognition

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Statistical Methods and Models

Physical Sciences → Mathematics → Statistics and Probability

Advanced Measurement and Detection Methods

Physical Sciences → Engineering → Electrical and Electronic Engineering

Ultrahigh Dimensional Multi-Class Linear Discriminant Analysis by Pairwise Sure Independence Screening

Metrics

Citation History

Topics

Related Documents

Ultrahigh-Dimensional Multiclass Linear Discriminant Analysis by Pairwise Sure Independence Screening

ExSIS: Extended sure independence screening for ultrahigh-dimensional linear models

Sure Independence Screening for Ultrahigh Dimensional Feature Space

Sure independence screening in ultrahigh dimensional generalized additive models

Robust sure independence screening for ultrahigh dimensional non-normal data